Analytical Methods in Materials Science

Aim

The objective with the course is to give an in depth knowledge about the principles for modern measurement techniques and to operate advanced instrumentation that is being used in materials science today. The emphasis is directed towards techniques that are used both in industrial and university research and development laboratories. It provides knowledge for a position as a research director in industry or academia.

Content

The lectures covers the basic physical mechanisms of the interaction between solid matter and electromagnetic radiation, electrons and ions. Also fundamental aspects of diffraction and contrast theory are being covered. In addition the principles and usage of microprobes, electron spectroscopy techniques (AES and XPS), x-ray diffraction, electron microscopy (SEM and TEM), light optical microscopy, Atomic Force Microscopy (AFM) and ellipsometry are described.The course consists of 9 laborations covering the following techniques; Light Optical Microscopy, Ellipsometry, Scanning Electron Microscopy, Transmission Electron Microscopy, Electron Diffraction, X-ray Diffraction, Auger Electron Spectroscopy (AES), X-ray Photo Electron Spectroscopy (XPS), and Microprobe Analyses.